Hong works to map dynamic oxidation reactions
Publication Date:
Caption:
MIT materials science graduate student Wesley T. Hong in the lab.
Credits:
Photo: Denis Paiste/Materials Processing Center
Caption:
A lanthanum strontium cobaltite (LSC113) thin film in preparation for electrochemical impedance spectroscopy testing. The setup allows for measurement of a sample's oxygen surface exchange kinetics at high temperature and controlled atmosphere.
Credits:
Photo: Denis Paiste/Materials Processing Center
Caption:
Schematic charts heating of lanthanum strontium cobaltite thin film (LSC) results in reconfiguration of the LSC molecule. (a) Representative normal X-ray diffraction data of 90 nm LSC113 or 90 nm LSC113/214 films, (b) representative off-normal XRD phi scan. (c) Schematic of the crystallographic rotational relationships among the LSC214(001)tetragonal, LSC113(001)pc, GDC(001)cubic, and YSZ(001)cubic. Image at right illustrates the different crystallographies of LSC113 vs. LSC214. In situ XRD was performed on 90 nmLSC113 and 90 nm LSC113/214 at room temperature, 220 and 350 degrees Celsius, and 400 degrees Celsius (only for 90 nm LSC113) in ambient air.
Credits:
Image: <i>Journal of Physical Chemistry Letters</i>
